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RE: SJTP: Presentation




Ben - good work. It captures the essence of the discussions.

A couple of suggestions:

1. Under objectives, we also trying to guard against inappropriate frequency
response somewhere (usually high frequency ISI or baseline wander due to
poor low frequency response, improper gain loop, etc.).

2. Under tests, we also need a pattern for eye masking. This pattern may be
different than all others, depending on the intent of the eye mask
requirements.

For #2 - at a minimum, the pattern must be short (even shorter than BER-type
tests) due to slow sampling rates on scopes, yet contain enough frequency
response to test the mechanisms that may limit the eye. The current draft
calls out 2^23 or 2^31 - I believe these are too long.

Is the intent of mask testing (and the corresponding mask values) to capture
"3-sigma" events? Only DDJ events? This is not clear to me at this time
(Sorry, I missed earlier discussions about mask testing). 

Thanks, Tom Lindsay
Stratos
425/672-8005


-----Original Message-----
From: Ben Brown
To: serialpmd
Sent: 5/7/2001 1:52 PM
Subject: SJTP: Presentation


All,

Attached is my first cut at the presentation. I'd like to review
this at tomorrow's call. This needs to be made available to the
task force this week and I'll be presenting it in St. Louis. If
you get a chance to review it before the meeting, please feel
free to forward along any comments.

Thanks,
Ben

-- 
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Benjamin Brown
AMCC
2 Commerce Park West
Suite 104 
Bedford NH 03110
603-641-9837 - Work
603-491-0296 - Cell
603-626-7455 - Fax
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bbrown@amcc.com
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 <<SJTP_U~2.PPT>>