Thread Links | Date Links | ||||
---|---|---|---|---|---|
Thread Prev | Thread Next | Thread Index | Date Prev | Date Next | Date Index |
Good morning Ramana, all, See my reactions below.
Could you indicate which parts of the script are not correct and share a revision of the code in the reflector?
See below comment to 2).
Correct. Already illustrated in my last contribution.
This is not correct. Failure rate as function of time is used by any industry, and specifically by the automotive industry. Based on you argument, infant mortality would not be a problem for any IC in the market because the high failure rate at the beginning of the component life is going to be averaged in time. Also based on your premisses, we could argue that OEMs accept high mortality in e.g South Africa because statistically is going to be compensated with the cars in the e.g. North of Europe. The OEMs do not want to have high number of field returns during short periods of time. Moreover, the OEMs do not want any field return. The goals are two:
The rules are not mine. They are the result of consensus in the automotive industry.
See my comments above. You can use random temperature in time. But failures (ppm) at the end of mission profile are the same regardless the function of T(t). In some cases failures are accumulated sooner and in others later. I already showed this in my last contribution. Trying to use average failure rate is an indication that the reliability of 850nm VCSEL is marginal.
No, it is not correct. It is not mathematically equivalent and this methodology is not used in automotive.
To unsubscribe from the STDS-802-3-OMEGA list, click the following link: https://listserv.ieee.org/cgi-bin/wa?SUBED1=STDS-802-3-OMEGA&A=1 |