Colleagues,
Minutes: Thursday June 27, 8
AM PST conference call
Attendees (recorded by George
Zimmerman)
Bert Bergner
Bob Elliot -Panduit
Curtis Donahue-
UNH-IOL
Chris Diminico (MC
Communications)
George Zimmerman (CME Consulting /
Commscope)
Mehmet Tazebay
(Broadcom)
Meng Zeng
Peter Wu (Marvell)
Shaoan Dai
Sterling Vaden (OCC)
Sujan Pandey
Thomas Muller
Todd Herman
(Commscope)
Wes Mir (Delphi)
X. Bunlon
Xiaofeng Wang
(Qualcomm)
Zhenzhong Gu
(1)Reviewed patent
policy
(2)Reviewed presentation RTPGE
EMC Limit Lines; Mehmet Tazebay & Ahmad Chini, Broadcom
Corporation
>Basis for link segment mode
conversion limit line presented.
>>The limit line shown
correlates with the levels suggested for TX PSD and RX BCI immunity
levels.
>>The same limit can be
considered for MDI and inline connectors, CMC and
PHY.
>> Mode conversion for
1-pair UTP measurement compared against the limit line.
(2)Link segment return
loss
>>Sterling Vaden – modeling
results reviewed in Vaden_02-06-13_Channel models.pdf
>>Using compliant 6A
connector and cable RL models a 15 m link segment topology of 1m, 2m, 9m, 2m,
1m was modeled and presented.
Summary: The modeled link segment
(15 m) RL yielded ILD that will need to be considered in characterizing the link
segment insertion loss beyond current estimates for category cabling.
(4)Curtis Donahue (UNH-IOL)
presented an IEEE 802.3bp Channel Test Setup Update
>>Update to the UNH-IOL
test setup to further reduce effects on measurement results i.e.,
>>flexibility of styrofoam
can cause variations in cable to ground plane height
>>Wiring between panels and
could cause resonance in measurements
>>2’ by 4’ panel edges were
not covered with overlapping material