RE: [EFM] 10/29 EFM FEC Conf Call
Vipul,
May I suggest the term "laser cycle time" instead of
"laser on time", because it does includes all of the
"off" times, "ramp" times, etc, in addition to just
the "on" time.
Thank you,
Roy Bynum
At 08:21 AM 10/31/2002 -0800, Vipul Bhatt wrote:
Ariel,
A couple of quick clarifications, please.
You've defined a variable called "laser on time", but you mean
the
sum of laser off time, laser on time, AGC settling time and CDR
lock
time - is that correct?
Also, your spreadsheet refers to "split ratio", but your
analysis is
valid for the general situation where it doesn't have to be the
physical number of splits; it can be interpreted as number of guard
bands (or slots or grants) - is that correct?
Perhaps these interpretations are obvious to some, but I wanted to
be clear because we may be discussing this topic in the general
session on the 14th. Thanks.
Vipul
===========
> -----Original Message-----
> From: owner-stds-802-3-efm@majordomo.ieee.org
>
[mailto:owner-stds-802-3-efm@majordomo.ieee.org]On
Behalf Of Ariel
> Maislos
> Sent: Wednesday, October 30, 2002 10:45 AM
> To: 'larry rennie'; 'EFM TF'
> Subject: RE: [EFM] 10/29 EFM FEC Conf Call
>
>
> An aid to the discussion.
>
> - Ariel
>
> > -----Original Message-----
> > From: owner-stds-802-3-efm@majordomo.ieee.org
> >
[mailto:owner-stds-802-3-efm@majordomo.ieee.org]
On Behalf Of
> > larry rennie
> > Sent: Tuesday, October 29, 2002 10:02 AM
> > To: EFM TF
> > Subject: [EFM] 10/29 EFM FEC Conf Call
> >
> >
> >
> > Date: Wednesday, October 30, 2002
> > Time: 1:00 p.m. (EST) = 10:00a.m (PST)
> > Duration: 1 hour
> > Chair: Larry Rennie, National Semiconductor
> > Dial in: 1-816-650-0666 (direct)
> > Participant code: 744004
> >
> > Hosted by EFMA.
> > NOTE: 800 NUMBER IS NO LONGER AVAILABLE.
> >
> > Proposed Agenda/Discussion:
> >
> > 1. CDR low BER Testing . Status.
> >
> > 2. MPN low BER testing. Status.
> >
> > 3. Presentations for November (Kauai) EFM meeting.
> > a. Overall FEC status. Larry
R.(National Semi).
> > b. CDR testing results relative to the
CDR locking issue
> > at low BER when FEC
> > is used. Eric (UNH IOL).
> > c. MPN testing results relative to FEC
and low BER.
> Meir (Zonu).
> > d. FEC algorithm update (new material
and details). Lior
> > (Passave)?
> >
> > Presentations a and d will probably be before the whole
TF
> > and b and c will probably be before the Optics STF.
> >
> > Larry
> >
> >
> >
>