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[10GMMF] Notes from Sept 7 meeting on TP3 definition



Here are the notes from the TP3 Meeting.

1. Attendees
Lew Aronson
John Dallesasse
Piers Dawe
Ryan Latchman
Tom Lindsay
Martin Lobel
Andre van Schyndel
Yi Sun
Norm Swenson
Nick Weiner
Brent Whitlock
Ben Willcocks
Kevin Witt

2. Review Notes from Last Meeting (Aug 31)
No comments

3. Update on Experimental Results Regarding Non-Idealities in E-O-E (Abhijit)
No report.

4. Discussion on Parameter Fitting for the ISI Generator (Petre)
Petre was not on the call.  In a nicely complementary piece of work, Ben Willcocks presented his calculations of PIE metrics for a range of different 3-tap ISI generators: see http://ieee802.org/3/10GMMFSG/email/pdf00019.pdf .  He was interested to learn about the tolerances required of the ISI generator.  A kind of resonance at 1 UI spacing is seen.  Andre pointed out that tracking a varying ISI involves a kind of inverse space where the smooth curves may map into something more challenging.

5. Review work list of additional items

List of stressors:-
        a. Fiber loss/dispersion
        b. Connector loss/dispersion
        c. Time varying factors
        d. Modal Noise
        e. RIN
        f. Jitter
        g. Optical signal conditioning

re items a and b: we need criteria to choose among the 2- or 3-impulse stressors in Petre's work.  Possibilities are extent, symmetry, bandwidth, difficulty for real equalisers, ...

re items d and e: the Infineon folks will consider how to calculate the amount of sinusoidal interferer to emulate the modal noise and RIN.  Tom suggested the use of a PRBS instead of a sine wave, if EDC makes the spectrum of the interferer an issue - see http://ieee802.org/3/10GMMFSG/email/msg00256.html .

re action f: see Tom's email, URL as above.  Basically, tolerance to high frequency and low frequency jitter are different things and we need to require compliance to both.  Tom explained why the low frequency jitter tolerance is still important.  He proposed having two jitter specification frequencies.  It might be that (one or both?) jitter tolerances could be demonstrated at the IC level, to reduce test costs.  Piers suggested wording along the lines of "shall comply across this range of frequencies, and these spot frequencies are defined as the primary frequencies for testing".

re item g: We can live with the regular (Gigabit style) mode-conditioning patchcord unless a better option comes along.

Next call Tuesday Sept 14th. 9am CA, 12 NY, 5pm UK, 6pm Germany.  Agenda will include preparations for the Ottawa meeting.

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Best Regards,

Piers