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| Dear all, During ad-hoc of Oct 5th, in the discussion of my contribution it was suggested that my equations of failure rate are not correct. As I promised, this is the reference book I use for semiconductors reliability topics in general: “Reliability Prediction from Burn-In Data. Fit to Reliability Models”, by Joseph B. Bernstein. It is available in Amazon. I recommend to read sections 2.2 and 2.3 for the basics and to find reference of the used equations. If my calculations are wrong (i.e. application of the equations), as always, I am very open to discuss using specific data, compare calculations and understand the differences. Thanks and best regards, Rubén Pérez-Aranda CTO at KDPOF _____________________________________________________________ Knowledge Development for POF, S.L. A: Ronda de Poniente 14 2º CD, 28760, Tres Cantos (Madrid), Spain P: +34 91 804 33 87 Ext:110 M: +34 689 319 866 I: Subscribe our quarterly Automotive Update for regular news and technology insights. To unsubscribe from the STDS-802-3-25GAUTO-POF list, click the following link: https://listserv.ieee.org/cgi-bin/wa?SUBED1=STDS-802-3-25GAUTO-POF&A=1 |